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Reliability of Computing-In-Memory Concepts Based on Memris..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wouters, D. J. ; Brackmann, L. ; Jafari, A.... - p. 5.3.1-5.3.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019423