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Characterizing and Modelling of the BTI Reliability in IGZO..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Z. ; Chasin, A. ; Franco, J.... - p. 30.1.1-30.1.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019454