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1 Ergebnisse
1
Direct Quantitative Extraction of Internal Variables from M..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Passlack, Matthias
;
Tasneem, Nujhat
;
Wang, Zheng
... - p. 32.4.1-32.4.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019459
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Direct Quantitative Extraction of Internal Variables from Measured PUND Characteristics Providing New Key Insights into Physics and Performance of Silicon and Oxide Channel Ferroelectric FETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019459&Exemplar=1&LAN=DE A1 Passlack, Matthias A1 Tasneem, Nujhat A1 Wang, Zheng A1 Aabrar, Khandker A. A1 Hur, Jae A1 Chen, Hang A1 Hou, Vincent D.-H. A1 Chang, Chih-Sheng A1 Chang, Meng-Fan A1 Yu, Shimeng A1 Chern, Winston A1 Datta, Suman A1 Khan, Asif YR 2022 SN 2156-017X K1 Density measurement K1 Switches K1 Logic gates K1 Capacitance K1 Silicon K1 Time measurement K1 Iron SP 32.4.1 OP 32.4.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019459 DO https://doi.org/10.1109/IEDM45625.2022.10019459 SF ELIB - SuUB Bremen
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