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1 Ergebnisse
1
Superior Breakdown, Retention, and TDDB Lifetime for Ferroe..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Wu, J.-S.
;
Liao, P.-H.
;
Chang, S.-J.
... - p. 847-850 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019471
RT T1
2022 International Electron Devices Meeting (IEDM)
: T1
Superior Breakdown, Retention, and TDDB Lifetime for Ferroelectric Engineered Charge Trap Gate E-mode GaN MIS-HEMT
UL https://suche.suub.uni-bremen.de/peid=ieee-10019471&Exemplar=1&LAN=DE A1 Wu, J.-S. A1 Liao, P.-H. A1 Chang, S.-J. A1 Yang, T.-Y. A1 Teng, C.-Y. A1 Liang, Y.-K. A1 Panda, D. A1 Luc, Q. H. A1 Chang, E. Y. YR 2022 SN 2156-017X K1 Temperature measurement K1 Performance evaluation K1 Voltage measurement K1 X-ray scattering K1 Temperature K1 Electric breakdown K1 Thermal engineering SP 847 OP 850 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019471 DO https://doi.org/10.1109/IEDM45625.2022.10019471 SF ELIB - SuUB Bremen
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