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1 Ergebnisse
1
Systematic multiple filament statistical methodology using ..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Wu, Ernest
;
Li, Baozhen
;
Ando, Takashi
- p. 5.2.1-5.2.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019474
RT T1
2022 International Electron Devices Meeting (IEDM)
: T1
Systematic multiple filament statistical methodology using a successive varying-voltage technique for series resistance effect in post-breakdown (forming) characterization
UL https://suche.suub.uni-bremen.de/peid=ieee-10019474&Exemplar=1&LAN=DE A1 Wu, Ernest A1 Li, Baozhen A1 Ando, Takashi YR 2022 SN 2156-017X K1 Resistance K1 Systematics K1 Statistical analysis K1 Capacitors K1 Voltage K1 System-on-chip K1 Integrated circuit reliability K1 TDDB K1 ReRAM K1 Successive BD K1 series resistance SP 5.2.1 OP 5.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019474 DO https://doi.org/10.1109/IEDM45625.2022.10019474 SF ELIB - SuUB Bremen
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