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1 Ergebnisse
1
Novel all-around diamond integration with GaN HEMTs demonst..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Soman, R.
;
Malakoutian, M.
;
Shankar, B.
... - p. 30.8.1-30.8.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019509
RT T1
2022 International Electron Devices Meeting (IEDM)
: T1
Novel all-around diamond integration with GaN HEMTs demonstrating highly efficient device cooling
UL https://suche.suub.uni-bremen.de/peid=ieee-10019509&Exemplar=1&LAN=DE A1 Soman, R. A1 Malakoutian, M. A1 Shankar, B. A1 Field, D. A1 Akso, E. A1 Hatui, N. A1 Hines, N. J. A1 Graham, S. A1 Mishra, U. K. A1 Kuball, M. A1 Chowdhury, S. YR 2022 SN 2156-017X K1 Temperature measurement K1 Electrodes K1 Silicon carbide K1 Diamonds K1 Logic gates K1 HEMTs K1 Etching SP 30.8.1 OP 30.8.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019509 DO https://doi.org/10.1109/IEDM45625.2022.10019509 SF ELIB - SuUB Bremen
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