I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Investigation of Defect Engineering Toward Prolonged Endura..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lee, J.H. ; Chou, C.H. ; Liao, P.J.... - p. 32.6.1-32.6.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019519