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1 Ergebnisse
1
First demonstration of full integration and characterizatio..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Seo, Soo Man
;
Aikawa, Hisanori
;
Kim, Soo Gil
... - p. 10.1.1-10.1.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019549
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>First demonstration of full integration and characterization of 4F² 1S1M cells with 45 nm of pitch and 20 nm of MTJ size</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019549&Exemplar=1&LAN=DE A1 Seo, Soo Man A1 Aikawa, Hisanori A1 Kim, Soo Gil A1 Nagase, Toshihiko A1 Ito, Yuich A1 Ha, Tae Jung A1 Yoshino, Kenichi A1 Jung, Bo Kyung A1 Oikawa, Tadaaki A1 Jung, Ku Youl A1 Moon, Hyun In A1 Kim, Bum Su A1 Matsuoka, Fumiyoshi A1 Hatsuda, Kosuke A1 Hoya, Katsuhiko A1 Kim, Seiyon A1 Lee, Sung-Hoon A1 Na, Myung-Hee A1 Cha, Seon Yong YR 2022 SN 2156-017X K1 Silicon compounds K1 Electric potential K1 Costs K1 Scalability K1 Electron devices K1 Optimization K1 Commercialization SP 10.1.1 OP 10.1.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019549 DO https://doi.org/10.1109/IEDM45625.2022.10019549 SF ELIB - SuUB Bremen
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