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Engineering defects in pristine amorphous chalcogenides for..:

, In: 2022 International Electron Devices Meeting (IEDM),
Ambrosi, E. ; Wu, C. H. ; Lee, H. Y.... - p. 18.7.1-18.7.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019553