I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Modeling Fatigue-Breakdown Dilemma in Ferroelectric Hf0.5 Z..:

, In: 2022 International Electron Devices Meeting (IEDM),
Huang, Hsin-Hui ; Cho, Chen-Yi ; Lin, Tzu-Yao... - p. 13.5.1-13.5.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019559