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1 Ergebnisse
1
Testing Physical Unclonable Functions Implemented on Commer..:
, In:
2022 IEEE 12th International Conference on Consumer Electronics (ICCE-Berlin)
,
Anagnostopoulos, Nikolaos Athanasios
;
Fan, Yufan
;
Saleem, Muhammad Umair
... - p. 1-9 , 2022
Link:
https://doi.org/10.1109/ICCE-Berlin56473.2022.10021310
RT T1
2022 IEEE 12th International Conference on Consumer Electronics (ICCE-Berlin)
: T1
Testing Physical Unclonable Functions Implemented on Commercial Off-the-Shelf NAND Flash Memories Using Programming Disturbances
UL https://suche.suub.uni-bremen.de/peid=ieee-10021310&Exemplar=1&LAN=DE A1 Anagnostopoulos, Nikolaos Athanasios A1 Fan, Yufan A1 Saleem, Muhammad Umair A1 Mexis, Nico A1 Geloczi, Emiliia A1 Klement, Felix A1 Frank, Florian A1 Schaller, Andre A1 Arul, Tolga A1 Katzenbeisser, Stefan YR 2022 SN 2166-6822 K1 Measurement K1 Voltage K1 Smart homes K1 Memory modules K1 Programming K1 Physical unclonable function K1 Robustness K1 physical unclonable function (PUF) K1 lightweight cryptography K1 NAND Flash memory K1 environmental conditions K1 temperature variations K1 voltage variations K1 testing K1 robustness SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Berlin56473.2022.10021310 DO https://doi.org/10.1109/ICCE-Berlin56473.2022.10021310 SF ELIB - SuUB Bremen
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