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1 Ergebnisse
1
Analysis of ON Current and Ambipolar Current for Source Poc..:
, In:
2022 IEEE International Symposium on Smart Electronic Systems (iSES)
,
Chandra Babu, K Murali
;
Goel, Ekta
- p. 651-653 , 2022
Link:
https://doi.org/10.1109/iSES54909.2022.00144
RT T1 <cTitle>2022 IEEE International Symposium on Smart Electronic Systems (iSES)</cTitle>: T1 <Title>Analysis of ON Current and Ambipolar Current for Source Pocket Gate-Drain Underlap Double Gate Tunnel Field Effect Transistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10026945&Exemplar=1&LAN=DE A1 Chandra Babu, K Murali A1 Goel, Ekta YR 2022 K1 Performance evaluation K1 TFETs K1 Metals K1 Doping K1 Logic gates K1 Ions K1 Silicon K1 Ambipolar current K1 Gate-Drain Underlap K1 Source Pocket K1 DGTFET SP 651 OP 653 LK http://dx.doi.org/https://doi.org/10.1109/iSES54909.2022.00144 DO https://doi.org/10.1109/iSES54909.2022.00144 SF ELIB - SuUB Bremen
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