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STT-MRAM Read and Write Circuit for High Reliability and Po..:

, In: 2022 19th International SoC Design Conference (ISOCC),
Yun, Dong-Kil ; Chun, Jung-Hoon - p. 290-291 , 2022
Link: https://doi.org/10.1109/ISOCC56007.2022.10031601