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Electrically Detected Magnetic Resonance Study of High-Fiel..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Sharov, F. V. ; Moxim, S. J. ; Elko, M. J... - p. 1-4 , 2022
Link: https://doi.org/10.1109/IIRW56459.2022.10032735