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1 Ergebnisse
1
Impact of Single Defects on NBTI and PBTI Recovery in SiO2 ..:
, In:
2022 IEEE International Integrated Reliability Workshop (IIRW)
,
Tselios, K.
;
Knobloch, T.
;
Michl, J.
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IIRW56459.2022.10032748
RT T1 <cTitle>2022 IEEE International Integrated Reliability Workshop (IIRW)</cTitle>: T1 <Title>Impact of Single Defects on NBTI and PBTI Recovery in SiO2 Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10032748&Exemplar=1&LAN=DE A1 Tselios, K. A1 Knobloch, T. A1 Michl, J. A1 Waldhoer, D. A1 Schleich, C. A1 Ioannidis, E. A1 Enichlmair, H. A1 Minixhofer, R. A1 Grasser, T. A1 Waltl, M. YR 2022 SN 2374-8036 K1 Negative bias temperature instability K1 Silicon compounds K1 Thermal variables control K1 Current measurement K1 Exponential distribution K1 Threshold voltage K1 Nanoscale devices K1 Single defects K1 Charge Trapping K1 Positive and negative bias temperature instability (PBTI, NBTI) K1 Complementary cumulative distribution function (CCDF) K1 Exponential step height distribution SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IIRW56459.2022.10032748 DO https://doi.org/10.1109/IIRW56459.2022.10032748 SF ELIB - SuUB Bremen
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