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1 Ergebnisse
1
Investigating Reliability of NIR QD-based Photodiodes Under..:
, In:
2022 IEEE International Integrated Reliability Workshop (IIRW)
,
Hammad, Ismail
;
Coignus, Jean
;
Ney, David
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/IIRW56459.2022.10032751
RT T1
2022 IEEE International Integrated Reliability Workshop (IIRW)
: T1
Investigating Reliability of NIR QD-based Photodiodes Under Bias and Light Stres
UL https://suche.suub.uni-bremen.de/peid=ieee-10032751&Exemplar=1&LAN=DE A1 Hammad, Ismail A1 Coignus, Jean A1 Ney, David A1 Doyen, Celestin A1 Perrin, Sebastien A1 Ricq, Stephane A1 Cacho, Florian A1 Wantz, Guillaume A1 Federspiel, Xavier A1 Roy, David A1 Josse, Emmanuel YR 2022 SN 2374-8036 K1 Degradation K1 Quantum dots K1 Imaging K1 Switches K1 Receivers K1 Lead K1 Light emitting diodes K1 Quantum Dot (QD) K1 Quantum Film (QF) K1 reliability K1 photodiode K1 image sensors K1 NIR K1 SWIR K1 CELIV SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IIRW56459.2022.10032751 DO https://doi.org/10.1109/IIRW56459.2022.10032751 SF ELIB - SuUB Bremen
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