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Investigating Reliability of NIR QD-based Photodiodes Under..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Hammad, Ismail ; Coignus, Jean ; Ney, David... - p. 1-4 , 2022
Link: https://doi.org/10.1109/IIRW56459.2022.10032751