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1 Ergebnisse
1
Exploring Process-Voltage-Temperature Variations Impact on ..:
, In:
2022 IEEE International Integrated Reliability Workshop (IIRW)
,
Rizzi, Tommaso
;
Baroni, Andrea
;
Glukhov, Artem
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IIRW56459.2022.10032753
RT T1 <cTitle>2022 IEEE International Integrated Reliability Workshop (IIRW)</cTitle>: T1 <Title>Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10032753&Exemplar=1&LAN=DE A1 Rizzi, Tommaso A1 Baroni, Andrea A1 Glukhov, Artem A1 Bertozzi, Davide A1 Wenger, Christian A1 Ielmini, Daniele A1 Zambelli, Cristian YR 2022 SN 2374-8036 K1 Resistance K1 Performance evaluation K1 Multiplexing K1 Energy consumption K1 Resistive RAM K1 Programming K1 Routing K1 RRAM K1 Variability K1 Reliability K1 Low Conductance states K1 Multi-level SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IIRW56459.2022.10032753 DO https://doi.org/10.1109/IIRW56459.2022.10032753 SF ELIB - SuUB Bremen
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