I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Identification of stress factors and degradation mechanisms..:
, In:
2022 IEEE International Integrated Reliability Workshop (IIRW)
,
Sicre, Mathieu
;
Federspiel, Xavier
;
Roy, David
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IIRW56459.2022.10032759
RT T1 <cTitle>2022 IEEE International Integrated Reliability Workshop (IIRW)</cTitle>: T1 <Title>Identification of stress factors and degradation mechanisms inducing DCR drift in SPADs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10032759&Exemplar=1&LAN=DE A1 Sicre, Mathieu A1 Federspiel, Xavier A1 Roy, David A1 Mamby, Bastien A1 Coutier, Caroline A1 Calmon, Francis YR 2022 SN 2374-8036 K1 Degradation K1 Temperature measurement K1 Analytical models K1 Voltage measurement K1 Temperature K1 Current measurement K1 Aging K1 Single-Photon Avalanche Diode (SPAD) K1 Dark Count Rate (DCR) K1 reliability K1 High-Temperature Storage (HTS) K1 High-Temperature Operating Life (HTOL) K1 Technology Computer Aided Design (TCAD) K1 device modeling K1 defects K1 current density K1 thermal activation energy SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IIRW56459.2022.10032759 DO https://doi.org/10.1109/IIRW56459.2022.10032759 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
