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Gate-to-drain/source overlap and asymmetry effects on hot-c..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Devoge, P. ; Aziza, H. ; Lorenzini, P.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/IIRW56459.2022.10032763