I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Influence of total ionizing dose on LWM Bulk and SOI p-FinF..:
, In:
2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)
,
Ray, Abhishek
;
Naugarhiya, Alok
;
Mishra, Guru Prasad
- p. 421-425 , 2022
Link:
https://doi.org/10.1109/EDKCON56221.2022.10032853
RT T1
2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)
: T1
Influence of total ionizing dose on LWM Bulk and SOI p-FinFET
UL https://suche.suub.uni-bremen.de/peid=ieee-10032853&Exemplar=1&LAN=DE A1 Ray, Abhishek A1 Naugarhiya, Alok A1 Mishra, Guru Prasad YR 2022 K1 Performance evaluation K1 Integrated circuits K1 Modulation K1 Metals K1 Logic gates K1 Threshold voltage K1 Total ionizing dose K1 Total ionizing dose effects (TID) K1 Threshold voltage (Vth) K1 FinFET K1 Workfunction K1 Multigate SP 421 OP 425 LK http://dx.doi.org/https://doi.org/10.1109/EDKCON56221.2022.10032853 DO https://doi.org/10.1109/EDKCON56221.2022.10032853 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)