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1 Ergebnisse
1
Deep Learning for Nanoparticle Classification in SEM Microg..:
, In:
2022 11th International Conference On Software Process Improvement (CIMPS)
,
Toscano, Iker
;
De-la-Torre, Miguel
;
Juarez, Brenda Acevedo
. - p. 119-125 , 2022
Link:
https://doi.org/10.1109/CIMPS57786.2022.10035714
RT T1 <cTitle>2022 11th International Conference On Software Process Improvement (CIMPS)</cTitle>: T1 <Title>Deep Learning for Nanoparticle Classification in SEM Micrographs: Systematic Mapping</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10035714&Exemplar=1&LAN=DE A1 Toscano, Iker A1 De-la-Torre, Miguel A1 Juarez, Brenda Acevedo A1 Garcia Mireles, Gabriel Alberto YR 2022 K1 Scanning electron microscopy K1 Microscopy K1 Deep learning K1 Nanoparticles K1 Software K1 Photomicrography K1 Systematics K1 Micrograp K1 nanoparticles K1 deep learning K1 Scanning electron microscope K1 SEM SP 119 OP 125 LK http://dx.doi.org/https://doi.org/10.1109/CIMPS57786.2022.10035714 DO https://doi.org/10.1109/CIMPS57786.2022.10035714 SF ELIB - SuUB Bremen
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