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Optimizing the number of scan layers in multi-layered scann..:

, In: 2023 IEEE/SICE International Symposium on System Integration (SII),
Alsalem, Hussain ; Tanaka, Takayuki ; Honda, Takumi.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/SII55687.2023.10039205