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1 Ergebnisse
1
Total-Ionizing-Dose Tolerance Analysis of a Radiation-Harde..:
, In:
2023 IEEE International Conference on Consumer Electronics (ICCE)
,
Bamba, Daisuke
;
Watanabe, Minoru
;
Watanabe, Nobuya
- p. 1-2 , 2023
Link:
https://doi.org/10.1109/ICCE56470.2023.10043521
RT T1
2023 IEEE International Conference on Consumer Electronics (ICCE)
: T1
Total-Ionizing-Dose Tolerance Analysis of a Radiation-Hardened Image Sensor
UL https://suche.suub.uni-bremen.de/peid=ieee-10043521&Exemplar=1&LAN=DE A1 Bamba, Daisuke A1 Watanabe, Minoru A1 Watanabe, Nobuya YR 2023 SN 2158-4001 K1 Image sensors K1 Tolerance analysis K1 Logic gates K1 Aerospace electronics K1 Robot sensing systems K1 System-on-chip K1 Power generation K1 FPGA K1 Image sensor K1 optically reconfigurable gate array K1 radiation-hardened devices K1 VLSIs SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/ICCE56470.2023.10043521 DO https://doi.org/10.1109/ICCE56470.2023.10043521 SF ELIB - SuUB Bremen
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