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Functional IN CIRCUIT tester with FPAA:

, In: 2023 IEEE 21st World Symposium on Applied Machine Intelligence and Informatics (SAMI),
Gyorok, Gyorgy ; Mako, Margit ; Shvets, Olga - p. 000181-000184 , 2023
Link: https://doi.org/10.1109/SAMI58000.2023.10044515