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1 Ergebnisse
1
22-nm FDSOI CMOS Noise Modeling and Analysis in mm-Wave Fre..:
, In:
2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
,
Le, Quang Huy
;
Huynh, Dang Khoa
;
Lehmann, Steffen
... - p. 31-33 , 2023
Link:
https://doi.org/10.1109/SiRF56960.2023.10046210
RT T1
2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
: T1
22-nm FDSOI CMOS Noise Modeling and Analysis in mm-Wave Frequency Range
UL https://suche.suub.uni-bremen.de/peid=ieee-10046210&Exemplar=1&LAN=DE A1 Le, Quang Huy A1 Huynh, Dang Khoa A1 Lehmann, Steffen A1 Zhao, Zhixing A1 Schwan, Christoph A1 Kampfe, Thomas A1 Rudolph, Matthias YR 2023 SN 2474-9761 K1 Semiconductor device modeling K1 Radio frequency K1 Analytical models K1 Time-frequency analysis K1 Tuners K1 Silicon-on-insulator K1 CMOS technology K1 22 nm K1 FDSOI K1 mm-wave K1 noise K1 Pucel model SP 31 OP 33 LK http://dx.doi.org/https://doi.org/10.1109/SiRF56960.2023.10046210 DO https://doi.org/10.1109/SiRF56960.2023.10046210 SF ELIB - SuUB Bremen
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