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Simulation of Built-In Test Equipments based on Avalanche N..:

, In: 2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems,
Simoncini, Guendalina ; Alimenti, Federico - p. 34-37 , 2023
Link: https://doi.org/10.1109/SiRF56960.2023.10046216