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Verilator-based Fast Verification Methodology for BLE MAC H..:

, In: 2023 International Conference on Electronics, Information, and Communication (ICEIC),
Ham, Eunkyung ; Jeon, Yujin ; Lim, Jaeyun. - p. 1-3 , 2023
Link: https://doi.org/10.1109/ICEIC57457.2023.10049940