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1 Ergebnisse
1
Transistor Sizing Scheme for DICE-Based Radiation-Resilient..:
, In:
2023 International Conference on Electronics, Information, and Communication (ICEIC)
,
Park, Jung-Jin
;
Kang, Young-Min
;
Kim, Geon-Hak
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICEIC57457.2023.10049983
RT T1
2023 International Conference on Electronics, Information, and Communication (ICEIC)
: T1
Transistor Sizing Scheme for DICE-Based Radiation-Resilient Latches
UL https://suche.suub.uni-bremen.de/peid=ieee-10049983&Exemplar=1&LAN=DE A1 Park, Jung-Jin A1 Kang, Young-Min A1 Kim, Geon-Hak A1 Chang, Ik-Joon A1 Kim, Jinsang YR 2023 SN 2767-7699 K1 Latches K1 Systematics K1 Single event upsets K1 Focusing K1 Very large scale integration K1 Inverters K1 Transistors K1 double-node upset (DNU) K1 radiation-hardened latch K1 DICE K1 single-node upset (SNU) K1 soft error SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEIC57457.2023.10049983 DO https://doi.org/10.1109/ICEIC57457.2023.10049983 SF ELIB - SuUB Bremen
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