I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Significance of Equivalent Channel Temperature in Compact M..:
, In:
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
,
P, Sruthi M
;
K, Nidhin
;
Shanbhag, Ajay
... - p. 33-36 , 2022
Link:
https://doi.org/10.1109/BCICTS53451.2022.10051754
RT T1 <cTitle>2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)</cTitle>: T1 <Title>Significance of Equivalent Channel Temperature in Compact Modeling of GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10051754&Exemplar=1&LAN=DE A1 P, Sruthi M A1 K, Nidhin A1 Shanbhag, Ajay A1 Nair, Deleep R A1 Chakravorty, Anjan A1 DasGupta, Nandita A1 Gupta, Amitava Das YR 2022 SN 2831-4999 K1 Temperature measurement K1 Temperature dependence K1 Semiconductor device measurement K1 Voltage measurement K1 Computational modeling K1 Thermal resistance K1 HEMTs K1 Self-heating K1 GaN HEMT K1 equivalent temperature K1 thermal resistance K1 compact modeling SP 33 OP 36 LK http://dx.doi.org/https://doi.org/10.1109/BCICTS53451.2022.10051754 DO https://doi.org/10.1109/BCICTS53451.2022.10051754 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
