I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Application of intelligent fault diagnosis technology in AC..:
, In:
2022 4th International Academic Exchange Conference on Science and Technology Innovation (IAECST)
,
Meng, Hao
;
Gong, Naifa
;
Xu, Wenli
... - p. 1532-1537 , 2022
Link:
https://doi.org/10.1109/IAECST57965.2022.10061885
RT T1 <cTitle>2022 4th International Academic Exchange Conference on Science and Technology Innovation (IAECST)</cTitle>: T1 <Title>Application of intelligent fault diagnosis technology in AC voltage regulating circuit</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10061885&Exemplar=1&LAN=DE A1 Meng, Hao A1 Gong, Naifa A1 Xu, Wenli A1 Yao, Xiaoshan A1 Mao, Huihuang A1 Liao, Neng YR 2022 K1 Technological innovation K1 Manuals K1 Fault location K1 Feature extraction K1 Nonhomogeneous media K1 Feedforward neural networks K1 Circuit faults K1 Keywords-AC voltage regulating Circuit K1 Fault Eigenvector K1 Multilayer feedforward neural network K1 Intelligent fault diagnosis SP 1532 OP 1537 LK http://dx.doi.org/https://doi.org/10.1109/IAECST57965.2022.10061885 DO https://doi.org/10.1109/IAECST57965.2022.10061885 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
