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MC/DC Test Case Automatic Generation for Safety-Critical Sy..:

, In: 2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS),
Wang, Cong ; Sun, Haiying ; Dou, Hui.. - p. 732-743 , 2022
Link: https://doi.org/10.1109/QRS57517.2022.00079