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1 Ergebnisse
1
Deep Learning-based AOI System for Detecting Component Mark:
, In:
2023 IEEE International Conference on Big Data and Smart Computing (BigComp)
,
Chang, Yi-Ming
;
Lin, Ti-Li
;
Chi, Hung-Chun
. - p. 243-247 , 2023
Link:
https://doi.org/10.1109/BigComp57234.2023.00046
RT T1
2023 IEEE International Conference on Big Data and Smart Computing (BigComp)
: T1
Deep Learning-based AOI System for Detecting Component Marks
UL https://suche.suub.uni-bremen.de/peid=ieee-10066828&Exemplar=1&LAN=DE A1 Chang, Yi-Ming A1 Lin, Ti-Li A1 Chi, Hung-Chun A1 Lin, Wei-Kai YR 2023 SN 2375-9356 K1 Training K1 Printing K1 Brightness K1 Surface mount technology K1 Production K1 Optical fiber networks K1 Optical imaging K1 surface mount technology (SMT) K1 printing circuit board (PCB) K1 printing circuit board assembly (PCBA) K1 styling K1 automated optical inspection (AOI) K1 convolutional neural networks (CNN) SP 243 OP 247 LK http://dx.doi.org/https://doi.org/10.1109/BigComp57234.2023.00046 DO https://doi.org/10.1109/BigComp57234.2023.00046 SF ELIB - SuUB Bremen
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