I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
2.2 A 5G Mobile Gaming-Centric SoC with High-Performance Th..:
, In:
2023 IEEE International Solid- State Circuits Conference (ISSCC)
,
Huang, Bo-Jr
;
Tsai, Alfred
;
Hsieh, Lear
... - p. 40-42 , 2023
Link:
https://doi.org/10.1109/ISSCC42615.2023.10067271
RT T1
2023 IEEE International Solid- State Circuits Conference (ISSCC)
: T1
2.2 A 5G Mobile Gaming-Centric SoC with High-Performance Thermal Management in 4nm FinFET
UL https://suche.suub.uni-bremen.de/peid=ieee-10067271&Exemplar=1&LAN=DE A1 Huang, Bo-Jr A1 Tsai, Alfred A1 Hsieh, Lear A1 Chang, Kathleen A1 Tsai, C.-J. A1 Chen, Jia-Ming A1 Fang, Eric Jia-Wei A1 Hsueh, Sung S.-Y. A1 Ciao, Jack A1 Chen, Barry A1 Chang, Chuck A1 Kao, Ping A1 Wang, Ericbill A1 Chen, Harry H. A1 Mair, Hugh A1 Hwang, Shih-Arn YR 2023 SN 2376-8606 K1 Temperature sensors K1 Temperature measurement K1 Temperature distribution K1 5G mobile communication K1 Benchmark testing K1 Thermal management K1 FinFETs SP 40 OP 42 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC42615.2023.10067271 DO https://doi.org/10.1109/ISSCC42615.2023.10067271 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)