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1 Ergebnisse
1
20.1 A High Common-Mode Transient Immunity GaN-on-SOI Gate ..:
, In:
2023 IEEE International Solid- State Circuits Conference (ISSCC)
,
Li, Si-Yi
;
Hung, Wei-Chien
;
Wang, Tz-Wun
... - p. 302-304 , 2023
Link:
https://doi.org/10.1109/ISSCC42615.2023.10067394
RT T1
2023 IEEE International Solid- State Circuits Conference (ISSCC)
: T1
20.1 A High Common-Mode Transient Immunity GaN-on-SOI Gate Driver for High dV/dt SiC Power Switch
UL https://suche.suub.uni-bremen.de/peid=ieee-10067394&Exemplar=1&LAN=DE A1 Li, Si-Yi A1 Hung, Wei-Chien A1 Wang, Tz-Wun A1 Hsu, Ya-Ting A1 Chen, Ke-Horng A1 Zheng, Kuo-Lin A1 Lin, Ying-Hsi A1 Lin, Shian-Ru A1 Tsai, Tsung-Yen YR 2023 SN 2376-8606 K1 MOSFET K1 Silicon carbide K1 High-voltage techniques K1 Switches K1 Logic gates K1 Gate drivers K1 Transient analysis SP 302 OP 304 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC42615.2023.10067394 DO https://doi.org/10.1109/ISSCC42615.2023.10067394 SF ELIB - SuUB Bremen
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