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A 0.64μm 4-Photodiode 1.28μm 50Mpixel CMOS Image Sensor wit..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),

Kim, Hyuncheol ; Kim, Yun Hyeok ; Moon, Sanghyuck... - p. 1-3 , 2023

Link: https://doi.org/10.1109/ISSCC42615.2023.10067732

RT 
T1 <cTitle>2023 IEEE International Solid- State Circuits Conference (ISSCC)</cTitle>: T1 <Title>A 0.64μm 4-Photodiode 1.28μm 50Mpixel CMOS Image Sensor with 0.98e- Temporal Noise and 20Ke- Full-Well Capacity Employing Quarter-Ring Source-Follower</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10067732&Exemplar=1&LAN=DE
				
A1 Kim, Hyuncheol
A1 Kim, Yun Hyeok
A1 Moon, Sanghyuck
A1 Kim, Hwanwoong
A1 Yoo, Byeongjun
A1 Park, Jueun
A1 Kim, Seyoung
A1 Koo, June-Mo
A1 Seo, Sewon
A1 Shin, Hye Ji
A1 Choi, Younghwan
A1 Kim, Jinwoo
A1 Kim, Kyungil
A1 Seo, Jae-Hoon
A1 Lim, Seunghyun
A1 Jung, Taesub
A1 Park, Howoo
A1 Jung, Sangil
A1 Ko, Juhyun
A1 Lee, Kyungho
A1 Ahn, JungChak
A1 Yim, JoonSeo
YR 2023
SN 2376-8606
K1 Image quality
K1 Image resolution
K1 CMOS image sensors
K1 Cameras
K1 Mobile handsets
K1 Signal to noise ratio
K1 Diffusion tensor imaging
SP 1
OP 3
LK http://dx.doi.org/https://doi.org/10.1109/ISSCC42615.2023.10067732
DO https://doi.org/10.1109/ISSCC42615.2023.10067732
SF ELIB - SuUB Bremen

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