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The Comparison of Photocurrent and Luminance Degradation to..:
, In:
2022 6th International Conference on System Reliability and Safety (ICSRS)
,
Lee, Jun-Tae
;
Choi, Yo-Min
;
Kim, Sang-Dae
- p. 489-493 , 2022
Link:
https://doi.org/10.1109/ICSRS56243.2022.10067766
RT T1 <cTitle>2022 6th International Conference on System Reliability and Safety (ICSRS)</cTitle>: T1 <Title>The Comparison of Photocurrent and Luminance Degradation to Estimate the Lifetime of OLED</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10067766&Exemplar=1&LAN=DE A1 Lee, Jun-Tae A1 Choi, Yo-Min A1 Kim, Sang-Dae YR 2022 K1 Degradation K1 Estimation K1 Organic light emitting diodes K1 Real-time systems K1 Safety K1 Photoconductivity K1 Reliability K1 OLED K1 degradation K1 photocurrent K1 luminance K1 lifetime estimation SP 489 OP 493 LK http://dx.doi.org/https://doi.org/10.1109/ICSRS56243.2022.10067766 DO https://doi.org/10.1109/ICSRS56243.2022.10067766 SF ELIB - SuUB Bremen
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