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Exploring the Explicit Modelling of Bias in Machine Learnin..:
, In:
2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA)
,
Al-Luhaybi, Mashael
;
Swift, Stephen
;
Counsell, Steve
. - p. 1799-1806 , 2022
Link:
https://doi.org/10.1109/ICMLA55696.2022.00277
RT T1 <cTitle>2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA)</cTitle>: T1 <Title>Exploring the Explicit Modelling of Bias in Machine Learning Classifiers: A Deep Multi-label ConvNet Approach *</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10069011&Exemplar=1&LAN=DE A1 Al-Luhaybi, Mashael A1 Swift, Stephen A1 Counsell, Steve A1 Tucker, Allan YR 2022 K1 Dimensionality reduction K1 Ethics K1 Adaptation models K1 Graphical models K1 Education K1 Decision making K1 Predictive models K1 Classification K1 Deep Learning K1 Explainable AI K1 Fully Convolutional Network SP 1799 OP 1806 LK http://dx.doi.org/https://doi.org/10.1109/ICMLA55696.2022.00277 DO https://doi.org/10.1109/ICMLA55696.2022.00277 SF ELIB - SuUB Bremen
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