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1 Ergebnisse
1
Experimental Investigations on Short-Circuit Capability of ..:
, In:
2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)
,
Lin, Chaobiao
;
Ren, Na
;
Xu, Hongyi
.. - p. 22-25 , 2023
Link:
https://doi.org/10.1109/SSLChinaIFWS57942.2023.1007096
RT T1 <cTitle>2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)</cTitle>: T1 <Title>Experimental Investigations on Short-Circuit Capability of a New Structure Planar SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10070963&Exemplar=1&LAN=DE A1 Lin, Chaobiao A1 Ren, Na A1 Xu, Hongyi A1 Zhu, Zhengyun A1 Sheng, Kuang YR 2023 K1 Electrodes K1 MOSFET K1 Solid modeling K1 Three-dimensional displays K1 Rapid thermal processing K1 Silicon carbide K1 Voltage SP 22 OP 25 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS57942.2023.10070963 DO https://doi.org/10.1109/SSLChinaIFWS57942.2023.10070963 SF ELIB - SuUB Bremen
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