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1 Ergebnisse
1
Junction temperature of 260 nm AlGaN UVC micro-LEDs under d..:
, In:
2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)
,
Zhao, Zhuoqun
;
Shan, Xinyi
;
Zhu, Shijie
... - p. 312-314 , 2023
Link:
https://doi.org/10.1109/SSLChinaIFWS57942.2023.1007113
RT T1 <cTitle>2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)</cTitle>: T1 <Title>Junction temperature of 260 nm AlGaN UVC micro-LEDs under different irradiated Ta fluences</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10071139&Exemplar=1&LAN=DE A1 Zhao, Zhuoqun A1 Shan, Xinyi A1 Zhu, Shijie A1 Qian, Zeyuan A1 Cui, Xugao A1 Zhang, Shanduan A1 Wang, Lei A1 Tian, Pengfei YR 2023 K1 Temperature measurement K1 Degradation K1 Radiation effects K1 Temperature K1 Voltage measurement K1 Ions K1 Light emitting diodes SP 312 OP 314 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071139 DO https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071139 SF ELIB - SuUB Bremen
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