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Research on the platform of metrological inspection calibra..:
, In:
2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA)
,
Sun, Jianghui
;
Wang, Shimin
;
Kong, Xuegang
... - p. 57-61 , 2023
Link:
https://doi.org/10.1109/ICPECA56706.2023.10075995
RT T1 <cTitle>2023 IEEE 3rd International Conference on Power, Electronics and Computer Applications (ICPECA)</cTitle>: T1 <Title>Research on the platform of metrological inspection calibration</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10075995&Exemplar=1&LAN=DE A1 Sun, Jianghui A1 Wang, Shimin A1 Kong, Xuegang A1 Tan, Bo A1 Hu, Xu A1 Ying, Jie YR 2023 K1 Power measurement K1 Automation K1 Computer applications K1 Inspection K1 Metrology K1 Data processing K1 Libraries K1 metrological inspection K1 calibration services K1 calculation unit K1 formula automation SP 57 OP 61 LK http://dx.doi.org/https://doi.org/10.1109/ICPECA56706.2023.10075995 DO https://doi.org/10.1109/ICPECA56706.2023.10075995 SF ELIB - SuUB Bremen
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