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1 Ergebnisse
1
Research on Failure Mechanism and Health Evaluation Index S..:
, In:
2022 3rd International Conference on Advanced Electrical and Energy Systems (AEES)
,
Dang, Luzhi
;
Yang, Kai
;
Zhang, Qingping
... - p. 186-190 , 2022
Link:
https://doi.org/10.1109/AEES56284.2022.10079292
RT T1 <cTitle>2022 3rd International Conference on Advanced Electrical and Energy Systems (AEES)</cTitle>: T1 <Title>Research on Failure Mechanism and Health Evaluation Index System of Welding IGBT Module</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10079292&Exemplar=1&LAN=DE A1 Dang, Luzhi A1 Yang, Kai A1 Zhang, Qingping A1 Kang, Yongqiang A1 Li, Shuaibing A1 Li, Hongwei YR 2022 K1 Insulated gate bipolar transistors K1 Insulation K1 Welding K1 Failure analysis K1 Logic gates K1 Power electronics K1 Thermal analysis K1 insulated gate bipolar transistor K1 failure mechanism K1 evaluating indicator SP 186 OP 190 LK http://dx.doi.org/https://doi.org/10.1109/AEES56284.2022.10079292 DO https://doi.org/10.1109/AEES56284.2022.10079292 SF ELIB - SuUB Bremen
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