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1 Ergebnisse
1
Investigation on the impact of External Layout-dependent Ga..:
, In:
2022 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)
,
Mandal, Manish
;
Roy, Shamibrota Kishore
;
Basu, Kaushik
- p. 1-6 , 2022
Link:
https://doi.org/10.1109/PEDES56012.2022.10079986
RT T1 <cTitle>2022 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)</cTitle>: T1 <Title>Investigation on the impact of External Layout-dependent Gate-Drain Capacitance on the Switching Dynamics of Si SJMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10079986&Exemplar=1&LAN=DE A1 Mandal, Manish A1 Roy, Shamibrota Kishore A1 Basu, Kaushik YR 2022 K1 Resistance K1 MOSFET K1 Layout K1 Switching loss K1 Switches K1 Voltage K1 Logic gates K1 switching dynamics K1 silicon superjunction MOSFET K1 CooLMOS K1 parasitic capacitance SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/PEDES56012.2022.10079986 DO https://doi.org/10.1109/PEDES56012.2022.10079986 SF ELIB - SuUB Bremen
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