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Small Photoresist Defect Samples Augmentation Based on Gene..:

, In: 2023 IEEE 6th Information Technology,Networking,Electronic and Automation Control Conference (ITNEC),
Yang, Guang ; Li, Zhihang ; Yang, Zhijia. - p. 277-280 , 2023
Link: https://doi.org/10.1109/ITNEC56291.2023.10082214