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1 Ergebnisse
1
Refracive Index Sensor Based on a Chip of Etched Thin Cladd..:
, In:
2022 Asia Communications and Photonics Conference (ACP)
,
Cai, Heyi
;
Xiao, Xiangpeng
;
Dai, Yuze
... - p. 1984-1986 , 2022
Link:
https://doi.org/10.1109/ACP55869.2022.10088633
RT T1
2022 Asia Communications and Photonics Conference (ACP)
: T1
Refracive Index Sensor Based on a Chip of Etched Thin Cladding Waveguide Bragg Grating
UL https://suche.suub.uni-bremen.de/peid=ieee-10088633&Exemplar=1&LAN=DE A1 Cai, Heyi A1 Xiao, Xiangpeng A1 Dai, Yuze A1 Huang, Fanglei A1 Sun, Qizhen A1 Yan, Zhijun YR 2022 K1 Bragg gratings K1 Semiconductor device measurement K1 Sensitivity K1 Claddings K1 Optical device fabrication K1 Stability criteria K1 Refractive index K1 waveguide Bragg grating K1 etching K1 refractive index sensor SP 1984 OP 1986 LK http://dx.doi.org/https://doi.org/10.1109/ACP55869.2022.10088633 DO https://doi.org/10.1109/ACP55869.2022.10088633 SF ELIB - SuUB Bremen
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