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1
WIB-SAR: Write Intensity Based Selective Address Remapping:
, In:
2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID)
,
S, Aswathy N
;
Bhuinya, Deep
;
Kapoor, Hemangee K.
- p. 1-6 , 2023
Link:
https://doi.org/10.1109/VLSID57277.2023.00022
RT T1
2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID)
: T1
WIB-SAR: Write Intensity Based Selective Address Remapping
UL https://suche.suub.uni-bremen.de/peid=ieee-10089984&Exemplar=1&LAN=DE A1 S, Aswathy N A1 Bhuinya, Deep A1 Kapoor, Hemangee K. YR 2023 SN 2380-6923 K1 Phase change materials K1 Nonvolatile memory K1 Multicore processing K1 Resistive RAM K1 Energy resolution K1 Random access memory K1 Very large scale integration K1 Address remapping K1 Write-variation K1 Phase Change Memory K1 Lifetime SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/VLSID57277.2023.00022 DO https://doi.org/10.1109/VLSID57277.2023.00022 SF ELIB - SuUB Bremen
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