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1 Ergebnisse
1
Multi-type SRAM Test Structure with an Improved March LR Al..:
, In:
2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
,
Ning, Xinshun
;
Yang, Hongyong
;
Zhang, Mengdi
... - p. 578-582 , 2022
Link:
https://doi.org/10.1109/APCCAS55924.2022.10090328
RT T1 <cTitle>2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)</cTitle>: T1 <Title>Multi-type SRAM Test Structure with an Improved March LR Algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10090328&Exemplar=1&LAN=DE A1 Ning, Xinshun A1 Yang, Hongyong A1 Zhang, Mengdi A1 Wang, Yanji A1 Zhao, Ye A1 Qiao, Shushan YR 2022 K1 Couplings K1 Circuits and systems K1 Memory management K1 Asia K1 Random access memory K1 Built-in self-test K1 Circuit faults K1 static random-access memory K1 March LR algorithm K1 programmable memory built-in self-testing K1 fault coverage SP 578 OP 582 LK http://dx.doi.org/https://doi.org/10.1109/APCCAS55924.2022.10090328 DO https://doi.org/10.1109/APCCAS55924.2022.10090328 SF ELIB - SuUB Bremen
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