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Rev-RetinaNet: PCB defect detection algorithm based on impr..:

, In: 2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA),
Tang, Jiwei ; Zhao, Yiming ; Bai, Dan. - p. 653-658 , 2023
Link: https://doi.org/10.1109/EEBDA56825.2023.10090524