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Implementation of N-bit Universal BIST for Testing of Memor..:

, In: 2022 International Conference on Recent Trends in Microelectronics, Automation, Computing and Communications Systems (ICMACC),
Bhavana, N. ; Sarath Chandra, K. ; Khadar, Shaik. - p. 505-509 , 2022
Link: https://doi.org/10.1109/ICMACC54824.2022.10093512