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1 Ergebnisse
1
Technology-Dependent Modeling of MOSFET Parasitic Capacitan..:
, In:
2023 35th International Conference on Microelectronic Test Structure (ICMTS)
,
Navarro, Dondee
;
Tanaka, Chika
;
Adachi, Kanna
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICMTS55420.2023.10094071
RT T1 <cTitle>2023 35th International Conference on Microelectronic Test Structure (ICMTS)</cTitle>: T1 <Title>Technology-Dependent Modeling of MOSFET Parasitic Capacitances for Circuit Simulation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10094071&Exemplar=1&LAN=DE A1 Navarro, Dondee A1 Tanaka, Chika A1 Adachi, Kanna A1 Naito, Takeshi A1 Tada, Kenshi A1 Hokazono, Akira YR 2023 SN 2158-1029 K1 MOSFET K1 Circuit simulation K1 Simulation K1 Modulation K1 Logic gates K1 Capacitance K1 Microelectronics K1 overlap capacitance K1 RF-CMOS K1 MOSFET modeling SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS55420.2023.10094071 DO https://doi.org/10.1109/ICMTS55420.2023.10094071 SF ELIB - SuUB Bremen
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