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Test Circuit Design for Accurately Characterizing Cells' Ou..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Hong, Hao-Chiao ; Lin, Long-Yi ; Chen, Bo-Chang - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICMTS55420.2023.10094078